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Mixed Signal

Integrated circuit that handles both analog and digital signals.

See Also: Mixed Signal ATE, Mixed Signal Oscilloscopes, Mixed-Signal Test, Mixed Signal Testers, MIxed Signal Test Systems


Showing results: 346 - 360 of 361 items found.

  • MEMS Device-Oriented Testers

    SPEA S.p.A.

    Are your test requirements oriented to defined families of devices, with common characteristics? You do not need to purchase an expensive, general-purpose mixed signal tester: You can rely on SPEA DOT 100, a system designed to answer the test requirements of MEMS and other low-pin-count devices at an incredibly low cost.The DOT 100 is based on a revolutionary per-device architecture: each device under test has a dedicated CPU managing the entire test process, while each card hosts all the resources for the parallel test of 3 devices, in the size of a postcard.

  • Qualification Hardware & Sockets

    Reltech Limited

    Reltech Limited holds over 35 years’ experience in the design and manufacture of all types of qualification test hardware. Our advanced technology products include: HTOL Boards (Mother and Daughter cards) Burn-In Boards HAST Boards THB (humidity) Boards Burn-In Modules and frames Dynamic Driver cards (Digital, Analogue and Mixed signal) Back Planes Voltage regulator cards Custom electro-mechanical assemblies DUT Cassettes and test Fixtures

  • Ceramic Capacitor Input Water Level Gauge

    HR8008 - HighReach Measuring & Controlling System Co.,Ltd

    HR8008 is a high-precision pressure water level gauge that monitors surface water or groundwater level and water temperature for a long time. It uses ceramic pressure sensitive components with good stability, high precision and strong overload capability. It adopts advanced mixed signal processing technology. Full-scale digital linear correction can be realized, digital temperature error compensation in full temperature zone; compensation parameters are stored in non-volatile memory, multiple safety protection mechanisms are avoided, and products cannot be used due to loss of calibration parameters; Monitoring function effectively preventing accidents such as crashes and program runs, and greatly improves the reliability of the product.

  • Electrical Testing Services

    Integra Technologies

    Integra provides extensive experience with complex test development: Digital & Mixed Signal Devices: Microprocessor, Microcontrollers DSP, ASIC. Linear: DAC, ADC, Operational Amplifier, Comparator, Multiplexer, Interface, Discrete. Memory: SDRAM, DDR, SRAM, SSRAM, Flash, EEPROM, EPROM. Logic: 74xxx, 16/32-bit, ECL. RF, 8GHz typical and experience to 50GHz: PA, LNA, Filter, Mixer. Expertise in developing test plans (semi mfgr production & device characterization)

  • EOL/Functional Testing

    ARC Technology Solutions

    Whether you are testing RF LRU modules as a defense contractor, or implementing the next power supply tester for EV charge stations, ARC can create a custom, flexible automated end of line test solution for a variety of needs, with your budget in mind.Leverage our expertise with PXI mixed signal modular instruments, RF test capabilities and switching to complete your next solutions. Shorten your test development times, improve hardware and software standardization, and control your future test development costs by partnering with ARC on your next project.

  • SoC Test System

    V93000 SoC / Smart Scale - Advantest Corp.

    Advantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The user benefits are reduced test time, best repeatability and simplified program creation. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change.

  • GoldenGate RFIC Simulation Software

    Keysight Technologies

    GoldenGate RFIC Simulation and Analysis Software is an advanced simulation and analysis solution for integrated mixed signal RFIC designs that is fully integrated into the Cadence Analog Design Environment (ADE). GoldenGate is part of Keysight's RFIC simulation, analysis and verification solution that also includes Momentum for 3-D planar electromagnetic simulation, SystemVue & Ptolemy wireless test benches for system-level verification, and the Advanced Design System (ADS) Data Display for advanced data analysis. This suite links the RF system, subsystem, and component-level design and analysis as part of a unique and comprehensive RFIC design flow.

  • USB Oscilloscope, Logic Analyzer and Variable Power Supply

    Analog Discovery 2 - Digilent Inc.

    Digilent Analog Discovery 2, developed in conjunction with Analog Devices and supported by Xilinx University Program, is a multi-function instrument that allows users to measure, visualize, generate, record, and control mixed signal circuits of all kinds. The low-cost Analog Discovery 2 is small enough to fit in your pocket, but powerful enough to replace a stack of lab equipment, providing engineering students, hobbyists, and electronics enthusiasts the freedom to work with analog and digital circuits in virtually any environment, in or out of the lab. The analog and digital inputs and outputs can be connected to a circuit using simple wire probes; alternatively, the Analog Discovery BNC Adapter and BNC probes can be used to connect and utilize the inputs and outputs. Driven by the free WaveForms 2015 (Mac, Linux and Windows Compatible) software, Analog Discovery 2 can be configured to work as any one of several traditional instruments.

  • Package Test Loadboards/DIB

    Dynamic Test Solutions

    DTS Package Test (DIB) loadboards are designed to specific devices and configured for both hand test and fully automated handler applications. DTS loadboards incorporate any brand of socket or contactor and can be configured for multi-site testing. Designs incorporate all necessary components, connectors, mechanical hardware and stiffeners to provide a complete plug-n-play solution. DTS has a vast database of tester and handler information which allow designs to be started and completed quickly without burdening the customer to supply excessive information. DTS designers are experienced in all device types, including digital, analog, mixed signal and RF devices.

  • Muzzle Velocity Radars

    MVR Series - Innovative Technical Systems

    The MVR Series of Muzzle-Velocity Radars are Doppler-CW transceivers that measure the velocity of viewed objects such as projectiles. They use phase-locked millimeter-wave transmitter-receivers along with an integrated radome-protected antenna to illuminate objects under investigation. An optical boresighting aid provides alignment assistance for the narrow radiation patterns. Reflected signals from the target are received by the antenna and mixed to produce a video output equal to the Doppler spectrum of the target. A low-noise, variable gain video amplifier can drive a 50-ohm cable up to +1 volt output. The video amplifier has a feed-forward DC offset compensation circuit that extends the Doppler frequency response from under 1 Hz to over 2 MHz. An integrated DMM and LCD display on the front panel monitors various test points within the sensor to verify proper operation. The extremely rugged design allows the MVRs to withstand high acousitic shock environments so they can be located in close proximity to the projectile source.

  • JTAG Functional Test

    JFT - JTAG Technologies Inc.

    JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)

  • Automated Multi-Functional Tester

    QTouch 1408 C - Qmax Test Technologies Pvt. Ltd.

    QTouch 1408 C – Automated Multi-Functional Tester with in-built camera is designed to make automatic image capturing and probing of electrical signals with ease and speed especially in PCBs with high density/high pin count device that are mounted on the PCB. It is designed to move on X, Y, Z directions making it possible to probe every component as close as 20 mils. Easy tagging feature allows the user to get the real time XY coordinates using the library information with minimal intervention. CAD import feature is available for Auto Test Generation/to extract the XY coordinates from the CAD data. Qmax Automated Multi Functional Tester can perform Board level functional test of a PCB and guided probe / Back tracking diagnostics utility to reliably test Digital, Analog and Mixed Signal PCBs and fault isolation to the PCB level or component level.

  • Component Test and Analysis Laboratories

    Raytheon Company

    The Component Test and Analysis team specializes in electronic and mechanical components such as hybrids, connectors, cables, harnesses, passive or discrete components, and digital or linear devices. The test lab has extensive experience in developing test software to electrically and environmentally characterize virtually any integrated circuit, including analog, digital, mixed signal, converters, FPGA and ASICs, as well as experience in developing actual radiation environments for parts testing. The component analysis team offers the analytical expertise and advanced instrumentation to identify root cause explanation for a wide range of component-level failures, as well as the resources to evaluate for possible quality and reliability issues through non-destructive and destructive techniques. With access to a detailed database, the Component Test and Analysis team offers a 25-year history of test and analysis data — a valuable resource for addressing new customer requirements.

  • Ethernet PHY

    Macom Technology Solutions Holdings Inc.

    MACOM’s portfolio of 10G/25G/40G/50G/100G Ethernet Physical Layer (PHY) devices offer unparalleled performance while maintaining high density at low cost. Integrated high-speed, high performance mixed signal I/O using advanced CMOS process nodes support a variety of optical and copper connectivity interfaces allowing the Ethernet PHY product line to span rack and cluster connectivity within the data center, wireless fronthaul, midhual and backhaul connectivity for 5G wireless infrastructure, and seamlessly extend to core networks over DWDM optical links. Advanced features such as in-service eye monitors, traffic monitoring, optical module identification and link training are just a few of the advantages that MACOM’s portfolio provides for end users to leverage for faster bring up, higher reliability and smarter networks.

  • AMIDA 5000 Tester

    Amida Technology, Inc.

    AMIDA 5000 is a high-end performance test system, combining analog, mixed-signal and logic with the latest test solutions. High pin count - as many as 512 smart multi-function pinframes and 128 sites. Ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. This system has a higher number of parallel tests and a higher level of capability. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The 5000 series test system is the best analog, mixed signal, digital IC, PA test system for engineering verification and mass production. It can be easily connected to all well-known wafer probing machines and sorters, and also supports parallel test functions. The 5000 series meets customers' needs for high-precision, high-resolution, high-reliability, user-friendly, and low-cost testing and measurement of test systems.

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